SEM Process Technician or FIB Process Technician

Ampcus Inc. is a certified global provider of a broad range of Technology and Business consulting services. We are in search of a highly motivated candidate to join our talented Team.

Job Title: SEM Process Technician

Location(s): Albany, NY

Responsibilities:

* Collect, Prepare, image, and document the structure and/or composition of nanostructures related to semiconductor devices.

* Manage the queue of samples and cleaving/analysis instructions from the Process Engineering staff

* Sample preparation by hand cleave and micro-cleaver using tweezers

* Sample highlighting including but not limited for dilute Hydrofluoric Acid

* Imaging sample features utilizing Scanning Electron Microscopy (SEM]

* Collecting compositional feature data utilizing Energy-dispersive X-ray spectroscopy (EDX)

* Communicating imaging results to the Engineering staff

* Development and optimization of analysis techniques

* Train new users on sample Preparation and Analysis Equipment

* Update and maintain Training and certification documents for sample Preparation and Analysis Equipment

* Actively participate and contribute to continuous SEM Operations efficiency improvement

* Possible responsibilities could include in FAB operations

Qualifications:

* BS degree in Physical Science or equivalent experience is required

* Previous hands-on experience with X-SEM

* Hitachi SEM experience is greatly preferred

* Proficient use of handling samples ? 5mm with tweezers required

* Experience working in a FAB environment is desired

* The unrestricted right to work in the USA is required

Physical Requirements:

* Job duties include the preparation and handling of small samples for analysis. The candidate should be comfortable manipulating small samples (less than 5mm) and tools (tweezers, screwdriver, scribe, etc.) under a microscope.

* Ability to work Compressed Work Week Night Shift (i.e. 7pm - 7am) and weekends is required.

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Job Title: FIB Process Technician

Location(s): Albany, NY

Responsibilities:

• Collect, prepare, image, and document the structure and/or composition of nanostructures related to semiconductor devices.
• Manage the queue of samples and cleaving/analysis instructions from the Process Engineering staff
• Lamella preparation using Focused Ion Beam (FIB) tools.
• Sample preparation for FIB stub by hand cleave and tweezers.
• Transfer Grids to sample holders using tweezers.
• Imaging sample features utilizing Scanning Electron Microscopy (SEM], Transmission Electron. Microscopy (TEM), Scanning Transmission Electron Microscopy (STEM).
• Collecting compositional feature data utilizing Energy-dispersive X-ray spectroscopy (EDX) and Electron Energy Loss Spectroscopy (EELS).
• Communicating image and compositional results to the Engineering staff* Development and optimization of sample preparation and analysis techniques.
• Train new users on sample Preparation and Analysis Equipment.
• Update and maintain Training and certification documents for sample Preparation and Analysis Equipment
• Actively participate and contribute to continuous FIB Operations efficiency improvement.
• Possible responsibilities could include in FAB operations.

• Hitachi/ThermoFisher non-automated FIB experience preferred
• ThermoFisher TEM experience preferred
• Hitachi SEM experience preferred